OGUNNOWO, Enoch; OKEKE, Emmanuel Chukwuma; KOMI, Marvin; OGUNDAPO, Oluranti; IBE, Precious Nnamdi. Advances in Predictive Reliability Assessment and Failure Prevention for Semiconductor Manufacturing Equipment. International Journal of Recent Advances in Science and Technology, [S. l.], v. 7, n. 02, p. 11–28, 2020. DOI: 10.30750/. Disponível em: https://ijrast.in/index.php/ijrast/article/view/164. Acesso em: 5 nov. 2026.